The Type dimension of the CMP Slurries for SiC Wafer Polishing market is divided into four principal chemistries: colloidal silica‑based, alumina‑based, ceramic‑based, and hybrid formulations. Colloidal silica slurries dominate the high‑precision segment because their sub‑nanometer particle size delivers superior planarization control on epitaxial layers, directly influencing yield in power‑device manufacturing. Alumina‑based slurries, characterized by larger abrasive particles and higher hardness, are favored for bulk removal rates during early‑stage polishing of thick SiC substrates, thereby reducing cycle time and operational cost. Ceramic‑based slurries, typically comprising zirconia or silicon nitride, offer a balance between removal efficiency and surface defect mitigation, making them suitable for intermediate polishing steps. Hybrid formulations combine silica and alumina particles to tailor removal rates and surface finish simultaneously, addressing niche applications where both throughput and defectivity are critical. Collectively, these types allocate market share in proportion to their functional alignment with process stages, shaping the overall market size and growth trajectory.